TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Philipp Mand
  • Volodymyr Burkhay
  • Andre Rocke
  • Uwe Gieselmann
  • Leon Fauth
  • Markus Olbrich
  • Christophe Delepaut
  • Bernhard Wicht
  • Jens Friebe

External Research Organisations

  • European Space Research and Technology Centre (ESTEC)
  • Space Ic GmbH
  • University of Kassel
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Details

Original languageEnglish
Title of host publication2023 13th European Space Power Conference, ESPC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)979-8-3503-2899-8
ISBN (print)979-8-3503-2900-1
Publication statusPublished - 2023
Event13th European Space Power Conference, ESPC 2023 - Elche, Spain
Duration: 2 Oct 20236 Oct 2023

Abstract

High-performance applications that require a high output current and a faster transient response increase the need to place the power supply as close as possible to the load. A Point-of-Load converter is specifically designed to meet this requirement. In space, additional reliability criteria such as extended temperature ranges and radiation tolerance are important. In this paper the Total Ionizing Dose and Destructive Single Event Effects on a prototype rad-hard Point-of-Load converter for space applications are evaluated. The device is a fully integrated DC-DC converter IC with two switches and the control on one die. The device is capable of 40 V input and 8 A continuous output current. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. The radiation effects are analyzed and possible improvements in the design are given. Since not all transistors of the ATMX150RHA technology were previously tested against radiation, this paper gives more information on the radiation response of this technology.

Keywords

    DC-DC, Hi-Rel, IC, Point-of-Load, rad-hard, radiation, Single Event Effect (SEE), Space, Total Ionizing Dose (TID)

ASJC Scopus subject areas

Cite this

TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. / Mand, Philipp; Burkhay, Volodymyr; Rocke, Andre et al.
2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Mand, P, Burkhay, V, Rocke, A, Gieselmann, U, Fauth, L, Olbrich, M, Delepaut, C, Wicht, B & Friebe, J 2023, TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. in 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 13th European Space Power Conference, ESPC 2023, Elche, Spain, 2 Oct 2023. https://doi.org/10.1109/espc59009.2023.10413247
Mand, P., Burkhay, V., Rocke, A., Gieselmann, U., Fauth, L., Olbrich, M., Delepaut, C., Wicht, B., & Friebe, J. (2023). TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. In 2023 13th European Space Power Conference, ESPC 2023 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/espc59009.2023.10413247
Mand P, Burkhay V, Rocke A, Gieselmann U, Fauth L, Olbrich M et al. TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. In 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc. 2023 doi: 10.1109/espc59009.2023.10413247
Mand, Philipp ; Burkhay, Volodymyr ; Rocke, Andre et al. / TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.
Download
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title = "TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications",
abstract = "High-performance applications that require a high output current and a faster transient response increase the need to place the power supply as close as possible to the load. A Point-of-Load converter is specifically designed to meet this requirement. In space, additional reliability criteria such as extended temperature ranges and radiation tolerance are important. In this paper the Total Ionizing Dose and Destructive Single Event Effects on a prototype rad-hard Point-of-Load converter for space applications are evaluated. The device is a fully integrated DC-DC converter IC with two switches and the control on one die. The device is capable of 40 V input and 8 A continuous output current. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. The radiation effects are analyzed and possible improvements in the design are given. Since not all transistors of the ATMX150RHA technology were previously tested against radiation, this paper gives more information on the radiation response of this technology.",
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AU - Mand, Philipp

AU - Burkhay, Volodymyr

AU - Rocke, Andre

AU - Gieselmann, Uwe

AU - Fauth, Leon

AU - Olbrich, Markus

AU - Delepaut, Christophe

AU - Wicht, Bernhard

AU - Friebe, Jens

N1 - Publisher Copyright: © 2023 IEEE.

PY - 2023

Y1 - 2023

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KW - Hi-Rel

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KW - rad-hard

KW - radiation

KW - Single Event Effect (SEE)

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ER -

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