Details
| Original language | English |
|---|---|
| Article number | 045008 |
| Journal | Surface Topography: Metrology and Properties |
| Volume | 10 |
| Issue number | 4 |
| Early online date | 28 Oct 2022 |
| Publication status | Published - Dec 2022 |
Abstract
In recent years fractal geometry has been repeatedly shown to help describe and characterize micro-topographies. Important properties of micro-topographies include roughness or texture direction. Consequently, in this work, fractal geometry is investigated to determine texture direction. For this purpose, synthetic data and real height maps of different micro-topographies are evaluated using the fractal power spectrum density method. The results are compared with a manual determination of the texture direction and determining the texture direction according to ISO 25 178 using the S td parameter. The results show that the fractal method is more accurate than the currently standardized method. Another advantage is that secondary texture directions can be detected. Thus, the fractal method is well suited for characterizing micro-topographies and can complement existing parameters from ISO 25 178.
Keywords
- fractal dimension, fractal geometry, micro-topography, power spectrum density, surface metrology, texture analysis, texture direction
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Instrumentation
- Chemical Engineering(all)
- Process Chemistry and Technology
- Materials Science(all)
- Surfaces, Coatings and Films
- Materials Science(all)
- Materials Chemistry
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In: Surface Topography: Metrology and Properties, Vol. 10, No. 4, 045008, 12.2022.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Texture direction analysis of micro-topographies using fractal geometry
AU - Siemens, Stefan
AU - Kästner, Markus
AU - Reithmeier, Eduard
PY - 2022/12
Y1 - 2022/12
N2 - In recent years fractal geometry has been repeatedly shown to help describe and characterize micro-topographies. Important properties of micro-topographies include roughness or texture direction. Consequently, in this work, fractal geometry is investigated to determine texture direction. For this purpose, synthetic data and real height maps of different micro-topographies are evaluated using the fractal power spectrum density method. The results are compared with a manual determination of the texture direction and determining the texture direction according to ISO 25 178 using the S td parameter. The results show that the fractal method is more accurate than the currently standardized method. Another advantage is that secondary texture directions can be detected. Thus, the fractal method is well suited for characterizing micro-topographies and can complement existing parameters from ISO 25 178.
AB - In recent years fractal geometry has been repeatedly shown to help describe and characterize micro-topographies. Important properties of micro-topographies include roughness or texture direction. Consequently, in this work, fractal geometry is investigated to determine texture direction. For this purpose, synthetic data and real height maps of different micro-topographies are evaluated using the fractal power spectrum density method. The results are compared with a manual determination of the texture direction and determining the texture direction according to ISO 25 178 using the S td parameter. The results show that the fractal method is more accurate than the currently standardized method. Another advantage is that secondary texture directions can be detected. Thus, the fractal method is well suited for characterizing micro-topographies and can complement existing parameters from ISO 25 178.
KW - fractal dimension
KW - fractal geometry
KW - micro-topography
KW - power spectrum density
KW - surface metrology
KW - texture analysis
KW - texture direction
UR - http://www.scopus.com/inward/record.url?scp=85141763864&partnerID=8YFLogxK
U2 - 10.1088/2051-672X/ac9ad0
DO - 10.1088/2051-672X/ac9ad0
M3 - Article
AN - SCOPUS:85141763864
VL - 10
JO - Surface Topography: Metrology and Properties
JF - Surface Topography: Metrology and Properties
IS - 4
M1 - 045008
ER -