Details
Original language | English |
---|---|
Article number | 1663 |
Journal | Sensors |
Volume | 25 |
Issue number | 6 |
Publication status | Published - 7 Mar 2025 |
Abstract
Keywords
- optimal simulation; light deflection; ray tracing; uncertainty simulation; inhomogeneous refractive index fields; tailored forming, inhomogeneous refractive index fields, tailored forming, optimal simulation, ray tracing, uncertainty simulation, light deflection
ASJC Scopus subject areas
- Chemistry(all)
- Analytical Chemistry
- Computer Science(all)
- Information Systems
- Physics and Astronomy(all)
- Atomic and Molecular Physics, and Optics
- Biochemistry, Genetics and Molecular Biology(all)
- Biochemistry
- Physics and Astronomy(all)
- Instrumentation
- Engineering(all)
- Electrical and Electronic Engineering
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In: Sensors, Vol. 25, No. 6, 1663, 07.03.2025.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - GPU Ray Tracing for the Analysis of Light Deflection in Inhomogeneous Refractive Index Fields of Hot Tailored Forming Components
AU - Kern, Pascal
AU - Brower-Rabinowitsch, Max
AU - Hinz, Lennart
AU - Kästner, Markus
AU - Reithmeier, Eduard
PY - 2025/3/7
Y1 - 2025/3/7
N2 - In hot-forming, integrating in situ quality monitoring is essential for the early detection of thermally induced geometric deviations, especially in the production of hybrid bulk metal parts. Although hybrid components are key to meeting modern technical requirements and saving resources, they exhibit complex shrinkage behavior due to differing thermal expansion coefficients. During forming, these components are exposed to considerable temperature gradients, which result in density fluctuations in the ambient air. These fluctuations create an inhomogeneous refractive index field (IRIF), which significantly affects the accuracy of optical geometry reconstruction systems due to light deflection. This study utilizes existing simulation IRIF data to predict the magnitude and orientation of refractive index fluctuations. A light deflection simulation run on a GPU-accelerated ray tracing framework is used to assess the impact of IRIFs on optical measurements. The results of this simulation are used as a basis for selecting optimized measurement positions, reducing and quantifying uncertainties in surface reconstruction, and, therefore, improving the reliability of quality control in hot-forming applications.
AB - In hot-forming, integrating in situ quality monitoring is essential for the early detection of thermally induced geometric deviations, especially in the production of hybrid bulk metal parts. Although hybrid components are key to meeting modern technical requirements and saving resources, they exhibit complex shrinkage behavior due to differing thermal expansion coefficients. During forming, these components are exposed to considerable temperature gradients, which result in density fluctuations in the ambient air. These fluctuations create an inhomogeneous refractive index field (IRIF), which significantly affects the accuracy of optical geometry reconstruction systems due to light deflection. This study utilizes existing simulation IRIF data to predict the magnitude and orientation of refractive index fluctuations. A light deflection simulation run on a GPU-accelerated ray tracing framework is used to assess the impact of IRIFs on optical measurements. The results of this simulation are used as a basis for selecting optimized measurement positions, reducing and quantifying uncertainties in surface reconstruction, and, therefore, improving the reliability of quality control in hot-forming applications.
KW - optimal simulation; light deflection; ray tracing; uncertainty simulation; inhomogeneous refractive index fields; tailored forming
KW - inhomogeneous refractive index fields
KW - tailored forming
KW - optimal simulation
KW - ray tracing
KW - uncertainty simulation
KW - light deflection
UR - http://www.scopus.com/inward/record.url?scp=105000945206&partnerID=8YFLogxK
U2 - 10.3390/s25061663
DO - 10.3390/s25061663
M3 - Article
VL - 25
JO - Sensors
JF - Sensors
SN - 1424-3210
IS - 6
M1 - 1663
ER -