Single-electron tunneling through semiconducting nanostructures

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External Research Organisations

  • Max Planck Institute for Solid State Research (MPI-FKF)
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Original languageEnglish
Pages (from-to)1283-1292
Number of pages10
JournalElectrochimica acta
Volume40
Issue number10
Publication statusPublished - Jul 1995
Externally publishedYes

Abstract

Tunneling through semiconducting nanostructures is determined by the interplay between charging effects and the discrete level spectrum originating from the three-dimensional confinement. This interplay is studied in linear and nonlinear transport and for single and multiple structures. Several realizations and applications are discussed.

Keywords

    charging effects, semiconductors, transport experiments

ASJC Scopus subject areas

Cite this

Single-electron tunneling through semiconducting nanostructures. / Haug, Rolf J.
In: Electrochimica acta, Vol. 40, No. 10, 07.1995, p. 1283-1292.

Research output: Contribution to journalArticleResearchpeer review

Haug RJ. Single-electron tunneling through semiconducting nanostructures. Electrochimica acta. 1995 Jul;40(10):1283-1292. doi: 10.1016/0013-4686(95)00059-N
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abstract = "Tunneling through semiconducting nanostructures is determined by the interplay between charging effects and the discrete level spectrum originating from the three-dimensional confinement. This interplay is studied in linear and nonlinear transport and for single and multiple structures. Several realizations and applications are discussed.",
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note = "Funding information: Acknowledgemm-I gratefully acknowledge the hospitality and the discussions with numerous people, especially K. Lee, T. P. Smith III, D. Kern, J. M. Hong, L. L. Chang and L. Esaki at IBM, Yorktown Heights, where I started the experiments discussed here. Contributions of J. Weis, H. Pothier and R. Blick from the Max-Planck-lnstitut are also gratefully acknowledged. I thank K. Ploog and K. Eberl for providing MBE grown samples for some of the experiments. Discussions with D. Pfannkuche, W. Hausler, D. Weinmann and others have been also invaluable. I thank K. v. Klitzing for the support, encouragement and interest into this work. Part of this work has been supported by the Bundesministerium fiir Forschung und Technologie.",
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Download

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AU - Haug, Rolf J.

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