Details
| Original language | English |
|---|---|
| Title of host publication | 2018 IEEE 2nd International Conference on Dielectrics (ICD) |
| Pages | 1-6 |
| Number of pages | 6 |
| Publication status | Published - 2018 |
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Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. / Norouzi, Younes; Frohne, Christian; Gauler, Volker et al.
2018 IEEE 2nd International Conference on Dielectrics (ICD). 2018. p. 1-6.
2018 IEEE 2nd International Conference on Dielectrics (ICD). 2018. p. 1-6.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
Norouzi, Y, Frohne, C, Gauler, V, Werle, P & Seifi, S 2018, Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. in 2018 IEEE 2nd International Conference on Dielectrics (ICD). pp. 1-6.
Norouzi, Y., Frohne, C., Gauler, V., Werle, P., & Seifi, S. (2018). Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. In 2018 IEEE 2nd International Conference on Dielectrics (ICD) (pp. 1-6)
Norouzi Y, Frohne C, Gauler V, Werle P, Seifi S. Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables. In 2018 IEEE 2nd International Conference on Dielectrics (ICD). 2018. p. 1-6
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@inproceedings{2b761d687337482db3a4651195f0f1b5,
title = "Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables",
author = "Younes Norouzi and Christian Frohne and Volker Gauler and Peter Werle and Sahand Seifi",
year = "2018",
language = "English",
pages = "1--6",
booktitle = "2018 IEEE 2nd International Conference on Dielectrics (ICD)",
}
Download
TY - GEN
T1 - Feasibility of FDA method for the detection and classification of faults in extruded HVDC cables
AU - Norouzi, Younes
AU - Frohne, Christian
AU - Gauler, Volker
AU - Werle, Peter
AU - Seifi, Sahand
PY - 2018
Y1 - 2018
M3 - Conference contribution
SP - 1
EP - 6
BT - 2018 IEEE 2nd International Conference on Dielectrics (ICD)
ER -