Details
| Original language | English |
|---|---|
| Title of host publication | 2025 Pan Pacific Strategic Electronics Symposium, Pan Pacific 2025 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 9781944543358 |
| ISBN (print) | 979-8-3315-1198-2 |
| Publication status | Published - 27 Jan 2025 |
| Event | 2025 Pan Pacific Strategic Electronics Symposium, Pan Pacific 2025 - Maui, United States Duration: 27 Jan 2025 → 30 Jan 2025 |
Abstract
In the process of developing high-reliability microelectronics, experimental radiation testing plays a vital role in assuring the durability and correct functionality of the device. As three major classes of radiation effects affect components, different radiation qualification tests must be combined to give comprehensive radiation hardness assurance. This work provides an overview of radiation testing standards, radiation sources, and important considerations for radiation testing.
Keywords
- Radiation Testing, Radiation Tolerance, Reliability
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
- Engineering(all)
- Industrial and Manufacturing Engineering
- Engineering(all)
- Safety, Risk, Reliability and Quality
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Instrumentation
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2025 Pan Pacific Strategic Electronics Symposium, Pan Pacific 2025. Institute of Electrical and Electronics Engineers Inc., 2025.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Experimental Radiation Effect Characterization for Microelectronics
AU - Trumann, Eike
AU - Thieu, Gia Bao
AU - Vaya, Guillermo Pava
AU - Weide-Zaage, Kirsten
N1 - Publisher Copyright: © 2025 SMTA.
PY - 2025/1/27
Y1 - 2025/1/27
N2 - In the process of developing high-reliability microelectronics, experimental radiation testing plays a vital role in assuring the durability and correct functionality of the device. As three major classes of radiation effects affect components, different radiation qualification tests must be combined to give comprehensive radiation hardness assurance. This work provides an overview of radiation testing standards, radiation sources, and important considerations for radiation testing.
AB - In the process of developing high-reliability microelectronics, experimental radiation testing plays a vital role in assuring the durability and correct functionality of the device. As three major classes of radiation effects affect components, different radiation qualification tests must be combined to give comprehensive radiation hardness assurance. This work provides an overview of radiation testing standards, radiation sources, and important considerations for radiation testing.
KW - Radiation Testing
KW - Radiation Tolerance
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=105000789926&partnerID=8YFLogxK
U2 - 10.23919/PanPacific65826.2025.10908937
DO - 10.23919/PanPacific65826.2025.10908937
M3 - Conference contribution
AN - SCOPUS:105000789926
SN - 979-8-3315-1198-2
BT - 2025 Pan Pacific Strategic Electronics Symposium, Pan Pacific 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 Pan Pacific Strategic Electronics Symposium, Pan Pacific 2025
Y2 - 27 January 2025 through 30 January 2025
ER -