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3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC

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Projects

  1. X-ray microscopy as a fast response tool to exploit processing-microstructure-property relationships for advanced material development

    Maier, H. J. (Principal Investigator), Wriggers, P. (Co-Investigator) & Behrens, H. (Co-Investigator)

    1 Apr 2016 → 31 Mar 2018

    Project: Research