Details
| Original language | English |
|---|---|
| Article number | 127177 |
| Journal | Materials letters |
| Volume | 262 |
| Early online date | 14 Dec 2019 |
| Publication status | Published - 1 Mar 2020 |
Abstract
For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.
Keywords
- Electron microscopy, Grain boundaries, Microstructure, X-ray techniques
ASJC Scopus subject areas
- Materials Science(all)
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Mechanics of Materials
- Engineering(all)
- Mechanical Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
In: Materials letters, Vol. 262, 127177, 01.03.2020.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - 3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC
AU - Reschka, Silvia
AU - Gerstein, Gregory
AU - Herbst, Sebastian
AU - Munk, Lukas
AU - Wriggers, Peter
AU - Maier, Hans Jürgen
N1 - Funding information: The authors gratefully acknowledge financial support by Deutsche Forschungsgemeinschaft (DFG) through grant no. 282253287 . The XRM used was also funded by the DFG (grant no. 316923185 ).
PY - 2020/3/1
Y1 - 2020/3/1
N2 - For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.
AB - For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.
KW - Electron microscopy
KW - Grain boundaries
KW - Microstructure
KW - X-ray techniques
UR - http://www.scopus.com/inward/record.url?scp=85076543581&partnerID=8YFLogxK
U2 - 10.1016/j.matlet.2019.127177
DO - 10.1016/j.matlet.2019.127177
M3 - Article
AN - SCOPUS:85076543581
VL - 262
JO - Materials letters
JF - Materials letters
SN - 0167-577X
M1 - 127177
ER -