Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion

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OriginalspracheEnglisch
PublikationsstatusVeröffentlicht - 11 Aug. 2023
VeranstaltungSPIE Optical Metrology, 2023, Munich, Germany - München, München, Deutschland
Dauer: 26 Juni 202330 Juni 2023
Konferenznummer: 1262309

Konferenz

KonferenzSPIE Optical Metrology, 2023, Munich, Germany
Land/GebietDeutschland
OrtMünchen
Zeitraum26 Juni 202330 Juni 2023

Abstract

This study presents a method to generate synthetic microscopic surface images by adapting the pre-trained latent diffusion model Stable Diffusion and the pre-trained text encoder OpenCLIP-ViT/H. A confocal laser scanning microscope was used to acquire the dataset for transfer learning. The measured samples include metallic surfaces processed with different abrasive machining methods like grinding, polishing, or honing. The network is trained to generate microtopographies with these machining methods, with different materials (for example, aluminum, PVC, and steel) and roughness values (for example, milling with Ra=0.4 to Ra =12.5). The performance of the network is evaluated through visual inspection, and the objective image quality measures Peak Signal-to-Noise Ratio (PSNR), Structural Similarity Index Measure (SSIM), and Frechet Inception Distance (FID). The results demonstrate that the proposed method can generate realistic microtopographies, albeit with some limitations. These limitations may be due to the fact that the original training data for the Stable Diffusion network used mostly images from the Internet, which often show people or landscapes. It was also found that the lack of post-processing of the synthetic images may lead to a reduction in perceived sharpness and less finely detailed structures. Nevertheless, the performance of the model demonstrates a promising and effective approach to surface metrology and materials science, contributing to fields such as materials science and surface engineering.

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Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion. / Siemens, Stefan; Kästner, Markus; Reithmeier, Eduard.
2023. Abstract von SPIE Optical Metrology, 2023, Munich, Germany, München, Deutschland.

Publikation: KonferenzbeitragAbstractForschung

Siemens, S, Kästner, M & Reithmeier, E 2023, 'Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion', SPIE Optical Metrology, 2023, Munich, Germany, München, Deutschland, 26 Juni 2023 - 30 Juni 2023. https://doi.org/10.1117/12.2673643
Siemens, S., Kästner, M., & Reithmeier, E. (2023). Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion. Abstract von SPIE Optical Metrology, 2023, Munich, Germany, München, Deutschland. https://doi.org/10.1117/12.2673643
Siemens S, Kästner M, Reithmeier E. Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion. 2023. Abstract von SPIE Optical Metrology, 2023, Munich, Germany, München, Deutschland. doi: 10.1117/12.2673643
Siemens, Stefan ; Kästner, Markus ; Reithmeier, Eduard. / Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion. Abstract von SPIE Optical Metrology, 2023, Munich, Germany, München, Deutschland.
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