Details
Originalsprache | Englisch |
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Publikationsstatus | Veröffentlicht - 11 Aug. 2023 |
Veranstaltung | SPIE Optical Metrology, 2023, Munich, Germany - München, München, Deutschland Dauer: 26 Juni 2023 → 30 Juni 2023 Konferenznummer: 1262309 |
Konferenz
Konferenz | SPIE Optical Metrology, 2023, Munich, Germany |
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Land/Gebiet | Deutschland |
Ort | München |
Zeitraum | 26 Juni 2023 → 30 Juni 2023 |
Abstract
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Informatik (insg.)
- Angewandte Informatik
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2023. Abstract von SPIE Optical Metrology, 2023, Munich, Germany, München, Deutschland.
Publikation: Konferenzbeitrag › Abstract › Forschung
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TY - CONF
T1 - Synthetically Generated Microscope Images of Microtopographies Using Stable Diffusion
AU - Siemens, Stefan
AU - Kästner, Markus
AU - Reithmeier, Eduard
N1 - Conference code: 1262309
PY - 2023/8/11
Y1 - 2023/8/11
N2 - This study presents a method to generate synthetic microscopic surface images by adapting the pre-trained latent diffusion model Stable Diffusion and the pre-trained text encoder OpenCLIP-ViT/H. A confocal laser scanning microscope was used to acquire the dataset for transfer learning. The measured samples include metallic surfaces processed with different abrasive machining methods like grinding, polishing, or honing. The network is trained to generate microtopographies with these machining methods, with different materials (for example, aluminum, PVC, and steel) and roughness values (for example, milling with Ra=0.4 to Ra =12.5). The performance of the network is evaluated through visual inspection, and the objective image quality measures Peak Signal-to-Noise Ratio (PSNR), Structural Similarity Index Measure (SSIM), and Frechet Inception Distance (FID). The results demonstrate that the proposed method can generate realistic microtopographies, albeit with some limitations. These limitations may be due to the fact that the original training data for the Stable Diffusion network used mostly images from the Internet, which often show people or landscapes. It was also found that the lack of post-processing of the synthetic images may lead to a reduction in perceived sharpness and less finely detailed structures. Nevertheless, the performance of the model demonstrates a promising and effective approach to surface metrology and materials science, contributing to fields such as materials science and surface engineering.
AB - This study presents a method to generate synthetic microscopic surface images by adapting the pre-trained latent diffusion model Stable Diffusion and the pre-trained text encoder OpenCLIP-ViT/H. A confocal laser scanning microscope was used to acquire the dataset for transfer learning. The measured samples include metallic surfaces processed with different abrasive machining methods like grinding, polishing, or honing. The network is trained to generate microtopographies with these machining methods, with different materials (for example, aluminum, PVC, and steel) and roughness values (for example, milling with Ra=0.4 to Ra =12.5). The performance of the network is evaluated through visual inspection, and the objective image quality measures Peak Signal-to-Noise Ratio (PSNR), Structural Similarity Index Measure (SSIM), and Frechet Inception Distance (FID). The results demonstrate that the proposed method can generate realistic microtopographies, albeit with some limitations. These limitations may be due to the fact that the original training data for the Stable Diffusion network used mostly images from the Internet, which often show people or landscapes. It was also found that the lack of post-processing of the synthetic images may lead to a reduction in perceived sharpness and less finely detailed structures. Nevertheless, the performance of the model demonstrates a promising and effective approach to surface metrology and materials science, contributing to fields such as materials science and surface engineering.
KW - confocal laser scanning microscopy
KW - image generation
KW - machine learning
KW - microtopography
KW - stable diffusion
KW - surface metrology
UR - http://www.scopus.com/inward/record.url?scp=85173433713&partnerID=8YFLogxK
U2 - 10.1117/12.2673643
DO - 10.1117/12.2673643
M3 - Abstract
T2 - SPIE Optical Metrology, 2023, Munich, Germany
Y2 - 26 June 2023 through 30 June 2023
ER -