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Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autorschaft

Externe Organisationen

  • Universität Konstanz
  • Ludwig-Maximilians-Universität München (LMU)
  • Instytut Chemii Bioorganicznej Polskiej Akademii Nauk

Details

OriginalspracheEnglisch
Seiten (von - bis)89-94
Seitenumfang6
FachzeitschriftMaterials Science Forum
Jahrgang228-231
AusgabenummerPART 1
PublikationsstatusVeröffentlicht - Dez. 1996
Extern publiziertJa

Abstract

X-ray diffraction peaks of α-AI2O3 (NIST-Standard No 679) and Si obtained in the asymmetric transmission mode of the GUINIER geometry are fitted with asymmetrized functions. Best fits are obtained with an asymmetrized pseudo-VOIGT function. The fitted parameters (FWHM and asymmetry) for each component (gaussian and lorentzian) and their mixing coefficient show systematic trends against the diffraction angle 2θ. The applied function is found to be well suited for fitting strongly asymmetric peaks measured on a GUINIER diffractometer.

ASJC Scopus Sachgebiete

Zitieren

Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. / Schneider, A. M.; Paszkowicz, W.; Behrens, P. et al.
in: Materials Science Forum, Jahrgang 228-231, Nr. PART 1, 12.1996, S. 89-94.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Schneider, AM, Paszkowicz, W, Behrens, P & Felsche, J 1996, 'Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions', Materials Science Forum, Jg. 228-231, Nr. PART 1, S. 89-94.
Schneider, A. M., Paszkowicz, W., Behrens, P., & Felsche, J. (1996). Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. Materials Science Forum, 228-231(PART 1), 89-94.
Schneider AM, Paszkowicz W, Behrens P, Felsche J. Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. Materials Science Forum. 1996 Dez;228-231(PART 1):89-94.
Schneider, A. M. ; Paszkowicz, W. ; Behrens, P. et al. / Analysis of peak shapes in X-ray diffractometry (GUINIER geometry) of standard materials using asymmetric profile functions. in: Materials Science Forum. 1996 ; Jahrgang 228-231, Nr. PART 1. S. 89-94.
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