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Three-Dimensional Cell Counting for In-Situ Microscopy

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

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  • Universidad de Costa Rica

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Original languageEnglish
Title of host publication2008 19th International Conference on Pattern Recognition
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (print)9781424421756
Publication statusPublished - 23 Jan 2009

Publication series

NameProceedings - International Conference on Pattern Recognition
ISSN (Print)1051-4651

Abstract

In this contribution, an algorithm is presented for counting cells in the first-, second- and third-layers of three-dimensional three-layer cell clusters from a static intensity image captured by an in-situ microscope. The number of cells in an arbitrary cell cluster is estimated as the ratio between the sum of the areas of the image regions of the parallel projections of the first-, second-and third-layers of the cluster into the image plane and the image area of a circle with a radius equal to the average cell radius of the cluster. The experimental results revealed that counting the cells also in the secondand third-layers of the clusters improved the cell count in 56% in high cell concentrations.

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Three-Dimensional Cell Counting for In-Situ Microscopy. / Martinez, Geovanni; Frerichs, Jan Gerd; Rudolph, Guido et al.
2008 19th International Conference on Pattern Recognition. Institute of Electrical and Electronics Engineers Inc., 2009. (Proceedings - International Conference on Pattern Recognition).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Martinez, G, Frerichs, JG, Rudolph, G & Scheper, T 2009, Three-Dimensional Cell Counting for In-Situ Microscopy. in 2008 19th International Conference on Pattern Recognition. Proceedings - International Conference on Pattern Recognition, Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/icpr.2008.4761580
Martinez, G., Frerichs, J. G., Rudolph, G., & Scheper, T. (2009). Three-Dimensional Cell Counting for In-Situ Microscopy. In 2008 19th International Conference on Pattern Recognition (Proceedings - International Conference on Pattern Recognition). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/icpr.2008.4761580
Martinez G, Frerichs JG, Rudolph G, Scheper T. Three-Dimensional Cell Counting for In-Situ Microscopy. In 2008 19th International Conference on Pattern Recognition. Institute of Electrical and Electronics Engineers Inc. 2009. (Proceedings - International Conference on Pattern Recognition). doi: 10.1109/icpr.2008.4761580
Martinez, Geovanni ; Frerichs, Jan Gerd ; Rudolph, Guido et al. / Three-Dimensional Cell Counting for In-Situ Microscopy. 2008 19th International Conference on Pattern Recognition. Institute of Electrical and Electronics Engineers Inc., 2009. (Proceedings - International Conference on Pattern Recognition).
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AU - Frerichs, Jan Gerd

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AU - Scheper, Thomas

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