Details
Original language | English |
---|---|
Journal | Surface review and letters |
Publication status | Published - 1996 |
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
In: Surface review and letters, 1996.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique
AU - Woenckhaus, J.
AU - Schäfer, R.
AU - Becker, J.A.
PY - 1996
Y1 - 1996
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0037618420&partnerID=MN8TOARS
U2 - 10.1142/S0218625X9600067X
DO - 10.1142/S0218625X9600067X
M3 - Article
JO - Surface review and letters
JF - Surface review and letters
SN - 0218-625X
ER -