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Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique

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Original languageEnglish
JournalSurface review and letters
Publication statusPublished - 1996

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Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique. / Woenckhaus, J.; Schäfer, R.; Becker, J.A.
In: Surface review and letters, 1996.

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@article{18c87bffa93046a3bd6f7c5abce7193a,
title = "Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique",
author = "J. Woenckhaus and R. Sch{\"a}fer and J.A. Becker",
year = "1996",
doi = "10.1142/S0218625X9600067X",
language = "English",
journal = "Surface review and letters",
issn = "0218-625X",
publisher = "World Scientific Publishing Co. Pte Ltd",

}

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TY - JOUR

T1 - Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique

AU - Woenckhaus, J.

AU - Schäfer, R.

AU - Becker, J.A.

PY - 1996

Y1 - 1996

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U2 - 10.1142/S0218625X9600067X

DO - 10.1142/S0218625X9600067X

M3 - Article

JO - Surface review and letters

JF - Surface review and letters

SN - 0218-625X

ER -

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