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Particle Ordering: Order and Defects in Ceramic Semiconductor Nanoparticle Superstructures as a Function of Polydispersity and Aspect Ratio (Part. Part. Syst. Charact. 2/2017)

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Authors

  • Melanie Gerigk
  • Jochen Bahner
  • Tom Kollek
  • Stefan Helfrich
  • Sebastian Polarz

Research Organisations

Details

Original languageEnglish
JournalParticle and Particle Systems Characterization
Publication statusPublished - Feb 2017

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Particle Ordering: Order and Defects in Ceramic Semiconductor Nanoparticle Superstructures as a Function of Polydispersity and Aspect Ratio (Part. Part. Syst. Charact. 2/2017). / Gerigk, Melanie; Bahner, Jochen; Kollek, Tom et al.
In: Particle and Particle Systems Characterization, 02.2017.

Research output: Contribution to journalArticleResearchpeer review

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title = "Particle Ordering: Order and Defects in Ceramic Semiconductor Nanoparticle Superstructures as a Function of Polydispersity and Aspect Ratio (Part. Part. Syst. Charact. 2/2017)",
author = "Melanie Gerigk and Jochen Bahner and Tom Kollek and Stefan Helfrich and Rose Rosenberg and Helmut C{\"o}lfen and Sebastian Polarz",
year = "2017",
month = feb,
doi = "10.1002/ppsc.201770004",
language = "English",
journal = "Particle and Particle Systems Characterization",
issn = "0934-0866",
publisher = "Wiley-VCH Verlag",

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T2 - Order and Defects in Ceramic Semiconductor Nanoparticle Superstructures as a Function of Polydispersity and Aspect Ratio (Part. Part. Syst. Charact. 2/2017)

AU - Gerigk, Melanie

AU - Bahner, Jochen

AU - Kollek, Tom

AU - Helfrich, Stefan

AU - Rosenberg, Rose

AU - Cölfen, Helmut

AU - Polarz, Sebastian

PY - 2017/2

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DO - 10.1002/ppsc.201770004

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JO - Particle and Particle Systems Characterization

JF - Particle and Particle Systems Characterization

SN - 0934-0866

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