Details
| Original language | English |
|---|---|
| Article number | 02SP16 |
| Number of pages | 10 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 64 |
| Issue number | 2 |
| Early online date | 7 Feb 2025 |
| Publication status | Published - Feb 2025 |
Abstract
This study describes multi-frequency Rayleigh wave excitation below 10 MHz, which is impossible with a conventional piezoelectric-single-crystal surface acoustic wave (SAW) device. To overcome this limitation, we utilized a SAW device with an elliptical reflector focusing structure (ELIPS). The prototype ELIPS SAW device excited a Rayleigh wave on a duralumin surface at 1.1 MHz, 3.4 MHz, 5.6 MHz, and 7.9 MHz in the single device. The maximum vibration velocities were 0.38 m s−1, 0.21 m s−1, 0.070 m s−1, and 0.034 m s−1, respectively, which suggests the possibility of high-power mechatronics applications. To demonstrate the usefulness of the multi-frequency SAW below 10 MHz in a single device, we measured the frequency dependence of leaky SAW attenuation with a liquid droplet. The result showed that the acoustic properties of the liquid could be successfully estimated.
Keywords
- acoustic property, ELIPS, leaky SAW, Rayleigh wave, SAW device, sensor
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
- Physics and Astronomy(all)
- General Physics and Astronomy
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In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 64, No. 2, 02SP16, 02.2025.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Multi-frequency excitation of Rayleigh waves using an elliptical reflector focusing structure and its application for measurement of the acoustic properties of liquids
AU - Yamada, Kyohei
AU - Ieiri, Shoki
AU - Itoh, Shinsuke
AU - Kasashima, Takashi
AU - Imashiro, Chikahiro
AU - Twiefel, Jens
AU - Morita, Takeshi
N1 - Publisher Copyright: © 2025 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
PY - 2025/2
Y1 - 2025/2
N2 - This study describes multi-frequency Rayleigh wave excitation below 10 MHz, which is impossible with a conventional piezoelectric-single-crystal surface acoustic wave (SAW) device. To overcome this limitation, we utilized a SAW device with an elliptical reflector focusing structure (ELIPS). The prototype ELIPS SAW device excited a Rayleigh wave on a duralumin surface at 1.1 MHz, 3.4 MHz, 5.6 MHz, and 7.9 MHz in the single device. The maximum vibration velocities were 0.38 m s−1, 0.21 m s−1, 0.070 m s−1, and 0.034 m s−1, respectively, which suggests the possibility of high-power mechatronics applications. To demonstrate the usefulness of the multi-frequency SAW below 10 MHz in a single device, we measured the frequency dependence of leaky SAW attenuation with a liquid droplet. The result showed that the acoustic properties of the liquid could be successfully estimated.
AB - This study describes multi-frequency Rayleigh wave excitation below 10 MHz, which is impossible with a conventional piezoelectric-single-crystal surface acoustic wave (SAW) device. To overcome this limitation, we utilized a SAW device with an elliptical reflector focusing structure (ELIPS). The prototype ELIPS SAW device excited a Rayleigh wave on a duralumin surface at 1.1 MHz, 3.4 MHz, 5.6 MHz, and 7.9 MHz in the single device. The maximum vibration velocities were 0.38 m s−1, 0.21 m s−1, 0.070 m s−1, and 0.034 m s−1, respectively, which suggests the possibility of high-power mechatronics applications. To demonstrate the usefulness of the multi-frequency SAW below 10 MHz in a single device, we measured the frequency dependence of leaky SAW attenuation with a liquid droplet. The result showed that the acoustic properties of the liquid could be successfully estimated.
KW - acoustic property
KW - ELIPS
KW - leaky SAW
KW - Rayleigh wave
KW - SAW device
KW - sensor
UR - http://www.scopus.com/inward/record.url?scp=85217252923&partnerID=8YFLogxK
U2 - 10.35848/1347-4065/adacf0
DO - 10.35848/1347-4065/adacf0
M3 - Article
AN - SCOPUS:85217252923
VL - 64
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
SN - 0021-4922
IS - 2
M1 - 02SP16
ER -