Details
| Original language | English |
|---|---|
| Title of host publication | 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010 |
| Editors | J.M. Janiszewski, G. Lewandowski, Z. M. Joskiewicz, A. Kozlowska |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 290-293 |
| Number of pages | 4 |
| ISBN (electronic) | 9788374934268 |
| Publication status | Published - 13 Sept 2010 |
| Event | 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010 - Wroclaw, Poland Duration: 13 Sept 2010 → 17 Sept 2010 |
Publication series
| Name | 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010 |
|---|
Abstract
The complexity of modern systems on the one hand and the rising threat of (intentional) EMI on the other hand increase the necessity of systematical reliability assessment for electronic devices. For that purpose, methods known from probabilistic risk analysis offer convenient and proven approaches. Complex systems are composed of modules and subsystem which can lead to a failure, breakdown or even damage of the entire system when it is exposed to EMI. Generally, not every module or subsystem reacts equally to EMI. Moreover, consequences for the entire system caused by a failure of different subsystems may differ. Consequently, it is essential to determine those subsystems which contribute most to the failure probability of the entire system. An appropriate instrument to determine this contribution is the importance analysis which is presented in this paper. With the help of importance analysis best candidates for improvement efforts can be identified. Furthermore, the classical importance analysis is extended in order to include also the physical quantities such as pulse amplitude or shielding.
Keywords
- electromagnetic interferece, Importance analysis, multicomponent system, probabilistic system analysis
ASJC Scopus subject areas
- Engineering(all)
- Automotive Engineering
- Engineering(all)
- Electrical and Electronic Engineering
- Medicine(all)
- Public Health, Environmental and Occupational Health
- Physics and Astronomy(all)
- Instrumentation
- Computer Science(all)
- Computer Networks and Communications
- Engineering(all)
- Safety, Risk, Reliability and Quality
- Physics and Astronomy(all)
- Radiation
- Social Sciences(all)
- Law
Sustainable Development Goals
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9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010. ed. / J.M. Janiszewski; G. Lewandowski; Z. M. Joskiewicz; A. Kozlowska. Institute of Electrical and Electronics Engineers Inc., 2010. p. 290-293 (9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Importance Analysis to Describe Reliability of Systems
AU - Genender, Evgeni
AU - Mleczko, Marcin
AU - Garbe, Heyno
PY - 2010/9/13
Y1 - 2010/9/13
N2 - The complexity of modern systems on the one hand and the rising threat of (intentional) EMI on the other hand increase the necessity of systematical reliability assessment for electronic devices. For that purpose, methods known from probabilistic risk analysis offer convenient and proven approaches. Complex systems are composed of modules and subsystem which can lead to a failure, breakdown or even damage of the entire system when it is exposed to EMI. Generally, not every module or subsystem reacts equally to EMI. Moreover, consequences for the entire system caused by a failure of different subsystems may differ. Consequently, it is essential to determine those subsystems which contribute most to the failure probability of the entire system. An appropriate instrument to determine this contribution is the importance analysis which is presented in this paper. With the help of importance analysis best candidates for improvement efforts can be identified. Furthermore, the classical importance analysis is extended in order to include also the physical quantities such as pulse amplitude or shielding.
AB - The complexity of modern systems on the one hand and the rising threat of (intentional) EMI on the other hand increase the necessity of systematical reliability assessment for electronic devices. For that purpose, methods known from probabilistic risk analysis offer convenient and proven approaches. Complex systems are composed of modules and subsystem which can lead to a failure, breakdown or even damage of the entire system when it is exposed to EMI. Generally, not every module or subsystem reacts equally to EMI. Moreover, consequences for the entire system caused by a failure of different subsystems may differ. Consequently, it is essential to determine those subsystems which contribute most to the failure probability of the entire system. An appropriate instrument to determine this contribution is the importance analysis which is presented in this paper. With the help of importance analysis best candidates for improvement efforts can be identified. Furthermore, the classical importance analysis is extended in order to include also the physical quantities such as pulse amplitude or shielding.
KW - electromagnetic interferece
KW - Importance analysis
KW - multicomponent system
KW - probabilistic system analysis
UR - http://www.scopus.com/inward/record.url?scp=84894569697&partnerID=8YFLogxK
U2 - 10.23919/EMC.2010.10826251
DO - 10.23919/EMC.2010.10826251
M3 - Conference contribution
AN - SCOPUS:84894569697
T3 - 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010
SP - 290
EP - 293
BT - 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010
A2 - Janiszewski, J.M.
A2 - Lewandowski, G.
A2 - Joskiewicz, Z. M.
A2 - Kozlowska, A.
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010
Y2 - 13 September 2010 through 17 September 2010
ER -