Details
| Original language | English |
|---|---|
| Pages (from-to) | 2498-2501 |
| Number of pages | 4 |
| Journal | Optics Letters |
| Volume | 44 |
| Issue number | 10 |
| Early online date | 10 May 2019 |
| Publication status | Published - 15 May 2019 |
Abstract
We report on, to the best of our knowledge, the first characterization of deep ultraviolet (UV) pulses by the dispersion scan (d-scan) technique. Negatively chirped 8 fs deep UV pulses are generated via the phase transfer of shaped few-cycle near-infrared pulses in a sum frequency generation process with narrowband second harmonic. The pulses are characterized by a d-scan technique incorporating a cross-polarized wave (XPW) generation nonlinearity. Being a single-beam degenerate four-wave mixing process, XPW does not acquire frequency conversion and, thus, is ideally suited for characterizing pulses in the UV, where the material dispersion severely limits phase matching. The characterization method is benchmarked by measuring the dispersion effect of a known fused silica plate on the pulses.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Atomic and Molecular Physics, and Optics
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In: Optics Letters, Vol. 44, No. 10, 15.05.2019, p. 2498-2501.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Full characterization of 8 fs deep UV pulses via a dispersion scan
AU - Tajalli, Ayhan
AU - Kalousdian, Thomas K.
AU - Kretschmar, Martin
AU - Kleinert, Sven
AU - Morgner, Uwe
AU - Nagy, Tamas
N1 - Funding information: Deutsche Forschungsgemeinschaft (DFG) (Mo850/16-2); Cluster of Excellence PhoenixD (Photonics, Optics, and Engineering Innovation Across Disciplines) (EXC 2122, projectID 390833453); Bundesministerium für Bildung und Forschung (BMBF) (13N14064); Niedersächsisches Ministerium für Wissenschaft und Kultur (MWK) (Tailored Light).
PY - 2019/5/15
Y1 - 2019/5/15
N2 - We report on, to the best of our knowledge, the first characterization of deep ultraviolet (UV) pulses by the dispersion scan (d-scan) technique. Negatively chirped 8 fs deep UV pulses are generated via the phase transfer of shaped few-cycle near-infrared pulses in a sum frequency generation process with narrowband second harmonic. The pulses are characterized by a d-scan technique incorporating a cross-polarized wave (XPW) generation nonlinearity. Being a single-beam degenerate four-wave mixing process, XPW does not acquire frequency conversion and, thus, is ideally suited for characterizing pulses in the UV, where the material dispersion severely limits phase matching. The characterization method is benchmarked by measuring the dispersion effect of a known fused silica plate on the pulses.
AB - We report on, to the best of our knowledge, the first characterization of deep ultraviolet (UV) pulses by the dispersion scan (d-scan) technique. Negatively chirped 8 fs deep UV pulses are generated via the phase transfer of shaped few-cycle near-infrared pulses in a sum frequency generation process with narrowband second harmonic. The pulses are characterized by a d-scan technique incorporating a cross-polarized wave (XPW) generation nonlinearity. Being a single-beam degenerate four-wave mixing process, XPW does not acquire frequency conversion and, thus, is ideally suited for characterizing pulses in the UV, where the material dispersion severely limits phase matching. The characterization method is benchmarked by measuring the dispersion effect of a known fused silica plate on the pulses.
UR - http://www.scopus.com/inward/record.url?scp=85065969804&partnerID=8YFLogxK
U2 - 10.1364/ol.44.002498
DO - 10.1364/ol.44.002498
M3 - Article
C2 - 31090716
AN - SCOPUS:85065969804
VL - 44
SP - 2498
EP - 2501
JO - Optics Letters
JF - Optics Letters
SN - 0146-9592
IS - 10
ER -