Details
| Original language | English |
|---|---|
| Title of host publication | Optical Technology and Measurement for Industrial Applications Conference 2022 |
| Editors | Takeshi Hatsuzawa, Rainer Tutsch, Toru Yoshizawa |
| Publisher | SPIE |
| ISBN (electronic) | 9781510660670 |
| Publication status | Published - 8 Dec 2022 |
| Externally published | Yes |
| Event | Optical Technology and Measurement for Industrial Applications Conference 2022 - Yokohama, Japan Duration: 18 Apr 2022 → 22 Apr 2022 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 12480 |
| ISSN (Print) | 0277-786X |
| ISSN (electronic) | 1996-756X |
Abstract
Optical measuring methods based on the principle of structured illumination frequently apply phase shift evaluation for optical spatial coding. While these approaches allow for efficient and high-precision coding in many applications, they reach their limits in particular when different signal components are superimposed, which may occur due to multiple reflections on the workpiece surface. Therefore, in the present contribution, a novel approach in the field of structured illumination is presented, which implements spatial coding by a pattern sequence with increasing spatial frequency, based on similar approaches from the field of absolute distance interferometry. In addition to basics of the method, a first experimental result is presented, which shows that the method allows for a high-quality separation of superimposed signals.
Keywords
- deflectometry, fringe projection, multi-wavelength coding, optical spatial coding, structured illumination, structured light
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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Optical Technology and Measurement for Industrial Applications Conference 2022. ed. / Takeshi Hatsuzawa; Rainer Tutsch; Toru Yoshizawa. SPIE, 2022. 124800A (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 12480).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - A multi-wavelength approach to structured illumination
AU - Petz, Marcus
AU - Hagen, Paul Felix
AU - Tutsch, Rainer
N1 - Publisher Copyright: © 2022 SPIE. All rights reserved.
PY - 2022/12/8
Y1 - 2022/12/8
N2 - Optical measuring methods based on the principle of structured illumination frequently apply phase shift evaluation for optical spatial coding. While these approaches allow for efficient and high-precision coding in many applications, they reach their limits in particular when different signal components are superimposed, which may occur due to multiple reflections on the workpiece surface. Therefore, in the present contribution, a novel approach in the field of structured illumination is presented, which implements spatial coding by a pattern sequence with increasing spatial frequency, based on similar approaches from the field of absolute distance interferometry. In addition to basics of the method, a first experimental result is presented, which shows that the method allows for a high-quality separation of superimposed signals.
AB - Optical measuring methods based on the principle of structured illumination frequently apply phase shift evaluation for optical spatial coding. While these approaches allow for efficient and high-precision coding in many applications, they reach their limits in particular when different signal components are superimposed, which may occur due to multiple reflections on the workpiece surface. Therefore, in the present contribution, a novel approach in the field of structured illumination is presented, which implements spatial coding by a pattern sequence with increasing spatial frequency, based on similar approaches from the field of absolute distance interferometry. In addition to basics of the method, a first experimental result is presented, which shows that the method allows for a high-quality separation of superimposed signals.
KW - deflectometry
KW - fringe projection
KW - multi-wavelength coding
KW - optical spatial coding
KW - structured illumination
KW - structured light
UR - http://www.scopus.com/inward/record.url?scp=85145255377&partnerID=8YFLogxK
U2 - 10.1117/12.2660166
DO - 10.1117/12.2660166
M3 - Conference contribution
AN - SCOPUS:85145255377
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Technology and Measurement for Industrial Applications Conference 2022
A2 - Hatsuzawa, Takeshi
A2 - Tutsch, Rainer
A2 - Yoshizawa, Toru
PB - SPIE
T2 - Optical Technology and Measurement for Industrial Applications Conference 2022
Y2 - 18 April 2022 through 22 April 2022
ER -