Details
| Original language | English |
|---|---|
| Title of host publication | LCTES '13: Proceedings of the 14th ACM SIGPLAN/SIGBED conference on Languages, compilers and tools for embedded systems |
| Pages | 21-31 |
| Number of pages | 11 |
| Publication status | Published - Jun 2013 |
| Externally published | Yes |
| Event | 14th ACM SIGPLAN/SIGBED Conference on Languages, Compilers, Tools and Theory for Embedded Systems, LCTES 2013 - Seattle, WA, United States Duration: 20 Jun 2013 → 21 Jun 2013 |
Abstract
The reduction of structure sizes in microcontollers, environmental conditions or low supply voltages increase the susceptibility of embedded systems to soft errors. As a result, the employment of fault-detection and fault-tolerance measures is becoming a mandatory task even for moderately critical applications. Accordingly, software-based techniques have recently gained in popularity, and a multitude of approaches that differ in the number and frequency of tolerated errors as well as their associated overhead have been proposed. Using type-safe programming languages to isolate critical software components is very popular among those techniques. An automated application of fault-detection and fault-tolerance measures based on the type system of the programming language and static code analyses is possible. It facilitates an easy evaluation of the protection characteristics and costs as well as the migration of software to new hardware platforms with different failure rates. Transient faults, however, are not bound to the application code secured by the type system, but can also affect the correctness of the type system itself. Thereby, the type system might lose its ability to isolate critical components. As a consequence, it is essential to also protect the type system itself against soft errors. In this paper, we show how soft errors can affect the integrity of the type system. Furthermore, we provide means to secure it against these faults, thus preserving its isolating character. These measures can be applied selectively to achieve a suitable tradeoff between level of protection and resource consumption.
Keywords
- Embedded systems, Java, KESO, Real-time systems, Reliability, RTSJ
ASJC Scopus subject areas
- Computer Science(all)
- Software
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LCTES '13: Proceedings of the 14th ACM SIGPLAN/SIGBED conference on Languages, compilers and tools for embedded systems. 2013. p. 21-31.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - A JVM for Soft-Error-Prone Embedded Systems
AU - Stilkerich, Isabella
AU - Strotz, Michael
AU - Erhardt, Christoph
AU - Hoffmann, Martin
AU - Lohmann, Daniel
AU - Scheler, Fabian
AU - Schröder-Preikschat, Wolfgang
PY - 2013/6
Y1 - 2013/6
N2 - The reduction of structure sizes in microcontollers, environmental conditions or low supply voltages increase the susceptibility of embedded systems to soft errors. As a result, the employment of fault-detection and fault-tolerance measures is becoming a mandatory task even for moderately critical applications. Accordingly, software-based techniques have recently gained in popularity, and a multitude of approaches that differ in the number and frequency of tolerated errors as well as their associated overhead have been proposed. Using type-safe programming languages to isolate critical software components is very popular among those techniques. An automated application of fault-detection and fault-tolerance measures based on the type system of the programming language and static code analyses is possible. It facilitates an easy evaluation of the protection characteristics and costs as well as the migration of software to new hardware platforms with different failure rates. Transient faults, however, are not bound to the application code secured by the type system, but can also affect the correctness of the type system itself. Thereby, the type system might lose its ability to isolate critical components. As a consequence, it is essential to also protect the type system itself against soft errors. In this paper, we show how soft errors can affect the integrity of the type system. Furthermore, we provide means to secure it against these faults, thus preserving its isolating character. These measures can be applied selectively to achieve a suitable tradeoff between level of protection and resource consumption.
AB - The reduction of structure sizes in microcontollers, environmental conditions or low supply voltages increase the susceptibility of embedded systems to soft errors. As a result, the employment of fault-detection and fault-tolerance measures is becoming a mandatory task even for moderately critical applications. Accordingly, software-based techniques have recently gained in popularity, and a multitude of approaches that differ in the number and frequency of tolerated errors as well as their associated overhead have been proposed. Using type-safe programming languages to isolate critical software components is very popular among those techniques. An automated application of fault-detection and fault-tolerance measures based on the type system of the programming language and static code analyses is possible. It facilitates an easy evaluation of the protection characteristics and costs as well as the migration of software to new hardware platforms with different failure rates. Transient faults, however, are not bound to the application code secured by the type system, but can also affect the correctness of the type system itself. Thereby, the type system might lose its ability to isolate critical components. As a consequence, it is essential to also protect the type system itself against soft errors. In this paper, we show how soft errors can affect the integrity of the type system. Furthermore, we provide means to secure it against these faults, thus preserving its isolating character. These measures can be applied selectively to achieve a suitable tradeoff between level of protection and resource consumption.
KW - Embedded systems
KW - Java
KW - KESO
KW - Real-time systems
KW - Reliability
KW - RTSJ
UR - http://www.scopus.com/inward/record.url?scp=84890503309&partnerID=8YFLogxK
U2 - 10.1145/2465554.2465571
DO - 10.1145/2465554.2465571
M3 - Conference contribution
AN - SCOPUS:84890503309
SN - 9781450320856
SP - 21
EP - 31
BT - LCTES '13: Proceedings of the 14th ACM SIGPLAN/SIGBED conference on Languages, compilers and tools for embedded systems
T2 - 14th ACM SIGPLAN/SIGBED Conference on Languages, Compilers, Tools and Theory for Embedded Systems, LCTES 2013
Y2 - 20 June 2013 through 21 June 2013
ER -