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A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Peter Toth
  • Paul E. Shine
  • Sebastian Halama
  • Yerzhan Kudabay
  • Christian Ospelkaus

Research Organisations

External Research Organisations

  • Technische Universität Braunschweig
  • Keio University

Details

Original languageEnglish
Title of host publication2025 IEEE International Solid-State Circuits Conference, ISSCC 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)9798331541019
ISBN (print)979-8-3315-4102-6
Publication statusPublished - 16 Feb 2025
Event72nd IEEE International Solid-State Circuits Conference, ISSCC 2025 - San Francisco, United States
Duration: 16 Feb 202520 Feb 2025

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
ISSN (Print)0193-6530
ISSN (electronic)2376-8606

Abstract

Trapped ions (TI) are one of the leading platforms for the realization of a universal quantum computer (QC). They feature several advantages compared to competing technologies. Key benefits of TI qubits utilizing hyperfine transitions are the long achievable coherence time T2 of up to hours and the almost infinite excited state lifetime T1 [1]. The error rate of single-qubit operations is already in the 10-6 range [2], while the error rate of entangled two-qubit gates approaches the fault tolerance error-correction threshold of 10-4 [3,4]. The combined state preparation and measurement fidelity depends on the ion species and is usually above 99.5%. Ion traps can comfortably work at moderate cryogenic temperatures around 4 K, and even room temperature (RT) operation has been demonstrated [4]. The quantum-charge-coupled-device (QCCD) [5,6] architecture allows scalable ion trapping and shuttling, thus enabling all-to-all qubit interconnection.

ASJC Scopus subject areas

Cite this

A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers. / Toth, Peter; Shine, Paul E.; Halama, Sebastian et al.
2025 IEEE International Solid-State Circuits Conference, ISSCC 2025. Institute of Electrical and Electronics Engineers Inc., 2025. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Toth, P, Shine, PE, Halama, S, Kudabay, Y, Yamashit, K, Ishikuro, H, Ospelkaus, C & Issakov, V 2025, A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers. in 2025 IEEE International Solid-State Circuits Conference, ISSCC 2025. Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 72nd IEEE International Solid-State Circuits Conference, ISSCC 2025, San Francisco, California, United States, 16 Feb 2025. https://doi.org/10.1109/ISSCC49661.2025.10904696
Toth, P., Shine, P. E., Halama, S., Kudabay, Y., Yamashit, K., Ishikuro, H., Ospelkaus, C., & Issakov, V. (2025). A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers. In 2025 IEEE International Solid-State Circuits Conference, ISSCC 2025 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC49661.2025.10904696
Toth P, Shine PE, Halama S, Kudabay Y, Yamashit K, Ishikuro H et al. A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers. In 2025 IEEE International Solid-State Circuits Conference, ISSCC 2025. Institute of Electrical and Electronics Engineers Inc. 2025. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). doi: 10.1109/ISSCC49661.2025.10904696
Toth, Peter ; Shine, Paul E. ; Halama, Sebastian et al. / A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers. 2025 IEEE International Solid-State Circuits Conference, ISSCC 2025. Institute of Electrical and Electronics Engineers Inc., 2025. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).
Download
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AU - Yamashit, Kaoru

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