Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | ozad036 |
| Seiten (von - bis) | 1062-1070 |
| Seitenumfang | 9 |
| Fachzeitschrift | Microscopy and microanalysis |
| Jahrgang | 29 |
| Ausgabenummer | 3 |
| Publikationsstatus | Veröffentlicht - Juni 2023 |
| Extern publiziert | Ja |
Abstract
The size of nanoparticles is a critical parameter with regard to their performance. Therefore, precise measurement of the size distribution is often required. While electron microscopy (EM) is a useful tool to image large numbers of particles at once, manual analysis of individual particles in EM images is a time-consuming and labor-intensive task. Therefore, reliable automatic detection methods have long been desired. This paper introduces a novel automatic particle analysis software package based on the circular Hough transform (CHT). Our software package includes novel features to enhance precise particle analysis capabilities. We applied the CHT algorithm in an iterative workflow, which ensures optimal detection over wide radius intervals, to deal with overlapping particles. In addition, smart intensity criteria were implemented to resolve common difficult cases that lead to false particle detection. Implementing these criteria enabled an effective and precise analysis by minimizing detection of false particles. Overall, our approach showed reliable particle analysis results by resolving common types of particle overlaps and deformation with only negligible errors.
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- Physik und Astronomie (insg.)
- Instrumentierung
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in: Microscopy and microanalysis, Jahrgang 29, Nr. 3, ozad036, 06.2023, S. 1062-1070.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Smart Iterative Analysis Tool for the Size Distribution of Spherical Nanoparticles
AU - Guckel, Jannik
AU - Görke, Marion
AU - Garnweitner, Georg
AU - Park, Daesung
N1 - Publisher Copyright: © 2023 The Author(s). Published by Oxford University Press on behalf of the Microscopy Society of America.
PY - 2023/6
Y1 - 2023/6
N2 - The size of nanoparticles is a critical parameter with regard to their performance. Therefore, precise measurement of the size distribution is often required. While electron microscopy (EM) is a useful tool to image large numbers of particles at once, manual analysis of individual particles in EM images is a time-consuming and labor-intensive task. Therefore, reliable automatic detection methods have long been desired. This paper introduces a novel automatic particle analysis software package based on the circular Hough transform (CHT). Our software package includes novel features to enhance precise particle analysis capabilities. We applied the CHT algorithm in an iterative workflow, which ensures optimal detection over wide radius intervals, to deal with overlapping particles. In addition, smart intensity criteria were implemented to resolve common difficult cases that lead to false particle detection. Implementing these criteria enabled an effective and precise analysis by minimizing detection of false particles. Overall, our approach showed reliable particle analysis results by resolving common types of particle overlaps and deformation with only negligible errors.
AB - The size of nanoparticles is a critical parameter with regard to their performance. Therefore, precise measurement of the size distribution is often required. While electron microscopy (EM) is a useful tool to image large numbers of particles at once, manual analysis of individual particles in EM images is a time-consuming and labor-intensive task. Therefore, reliable automatic detection methods have long been desired. This paper introduces a novel automatic particle analysis software package based on the circular Hough transform (CHT). Our software package includes novel features to enhance precise particle analysis capabilities. We applied the CHT algorithm in an iterative workflow, which ensures optimal detection over wide radius intervals, to deal with overlapping particles. In addition, smart intensity criteria were implemented to resolve common difficult cases that lead to false particle detection. Implementing these criteria enabled an effective and precise analysis by minimizing detection of false particles. Overall, our approach showed reliable particle analysis results by resolving common types of particle overlaps and deformation with only negligible errors.
KW - circular Hough transform
KW - nanoparticle
KW - OpenCV
KW - particle size distribution analysis
KW - python
KW - transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85168736231&partnerID=8YFLogxK
U2 - 10.1093/micmic/ozad036
DO - 10.1093/micmic/ozad036
M3 - Article
VL - 29
SP - 1062
EP - 1070
JO - Microscopy and microanalysis
JF - Microscopy and microanalysis
SN - 1431-9276
IS - 3
M1 - ozad036
ER -