Loading [MathJax]/extensions/tex2jax.js

Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autorschaft

  • W. Lin
  • B. Geck
  • H. Eul
  • Ch Lanschützer

Organisationseinheiten

Externe Organisationen

  • Infineon Technologies Austria AG

Details

OriginalspracheEnglisch
Seiten (von - bis)353-358
Seitenumfang6
FachzeitschriftElektrotechnik und Informationstechnik (e+i) (Print)
Jahrgang124
Ausgabenummer11
PublikationsstatusVeröffentlicht - Nov. 2007

Abstract

The resonance frequency is an important parameter to characterize a Proximity Integrated Circuit Card (PICC). In this paper the resonance frequency of a PICC is defined and derived by using circuit analysis. Then a resonance frequency measurement method is investigated and a detailed error analysis is performed by simulation and measurements.

ASJC Scopus Sachgebiete

Zitieren

Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs. / Lin, W.; Geck, B.; Eul, H. et al.
in: Elektrotechnik und Informationstechnik (e+i) (Print), Jahrgang 124, Nr. 11, 11.2007, S. 353-358.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Lin W, Geck B, Eul H, Lanschützer C, Raggam P. Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs. Elektrotechnik und Informationstechnik (e+i) (Print). 2007 Nov;124(11):353-358. doi: 10.1007/s00502-007-0480-1
Download
@article{5ddeff6c7c744a239269c95f9721b6ba,
title = "Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs",
abstract = "The resonance frequency is an important parameter to characterize a Proximity Integrated Circuit Card (PICC). In this paper the resonance frequency of a PICC is defined and derived by using circuit analysis. Then a resonance frequency measurement method is investigated and a detailed error analysis is performed by simulation and measurements.",
keywords = "Measurement method, PICC, Resonance frequency",
author = "W. Lin and B. Geck and H. Eul and Ch Lansch{\"u}tzer and P. Raggam",
year = "2007",
month = nov,
doi = "10.1007/s00502-007-0480-1",
language = "English",
volume = "124",
pages = "353--358",
journal = "Elektrotechnik und Informationstechnik (e+i) (Print)",
issn = "0932-383X",
publisher = "Springer-Verlag Wien",
number = "11",

}

Download

TY - JOUR

T1 - Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs

AU - Lin, W.

AU - Geck, B.

AU - Eul, H.

AU - Lanschützer, Ch

AU - Raggam, P.

PY - 2007/11

Y1 - 2007/11

N2 - The resonance frequency is an important parameter to characterize a Proximity Integrated Circuit Card (PICC). In this paper the resonance frequency of a PICC is defined and derived by using circuit analysis. Then a resonance frequency measurement method is investigated and a detailed error analysis is performed by simulation and measurements.

AB - The resonance frequency is an important parameter to characterize a Proximity Integrated Circuit Card (PICC). In this paper the resonance frequency of a PICC is defined and derived by using circuit analysis. Then a resonance frequency measurement method is investigated and a detailed error analysis is performed by simulation and measurements.

KW - Measurement method

KW - PICC

KW - Resonance frequency

UR - http://www.scopus.com/inward/record.url?scp=37249016973&partnerID=8YFLogxK

U2 - 10.1007/s00502-007-0480-1

DO - 10.1007/s00502-007-0480-1

M3 - Article

AN - SCOPUS:37249016973

VL - 124

SP - 353

EP - 358

JO - Elektrotechnik und Informationstechnik (e+i) (Print)

JF - Elektrotechnik und Informationstechnik (e+i) (Print)

SN - 0932-383X

IS - 11

ER -