Generation of complex quantum states via integrated frequency combs

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Christian Reimer
  • Michael Kues
  • Piotr Roztocki
  • Benjamin Wetzel
  • Brent E. Little
  • Sai T. Chu
  • Lucia Caspani
  • David J. Moss
  • Roberto Morandotti

Externe Organisationen

  • Institut national de la recherche scientifique (INRS)
  • University of Glasgow
  • University of Sussex
  • Xi'an Institute of Optics and Precision Mechanics Chinese Academy of Sciences
  • City University of Hong Kong
  • University of Strathclyde
  • Swinburne University of Technology
  • University of Electronic Science and Technology of China
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Details

OriginalspracheEnglisch
Titel des SammelwerksProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten336-337
Seitenumfang2
ISBN (elektronisch)9783981537093
PublikationsstatusVeröffentlicht - 11 Mai 2017
Extern publiziertJa
Veranstaltung20th Design, Automation and Test in Europe, DATE 2017 - Swisstech, Lausanne, Schweiz
Dauer: 27 März 201731 März 2017

Publikationsreihe

NameProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

Abstract

The generation of optical quantum states on an integrated platform will enable low cost and accessible advances for quantum technologies such as secure communications and quantum computation. We demonstrate that integrated quantum frequency combs (based on high-Q microring resonators made from a CMOS-compatible, high refractive-index glass platform) can enable, among others, the generation of heralded single photons, cross-polarized photon pairs, as well as bi- and multi-photon entangled qubit states over a broad frequency comb covering the S, C, L telecommunications band, constituting an important cornerstone for future practical implementations of photonic quantum information processing.

ASJC Scopus Sachgebiete

Zitieren

Generation of complex quantum states via integrated frequency combs. / Reimer, Christian; Kues, Michael; Roztocki, Piotr et al.
Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. S. 336-337 7927012 (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Reimer, C, Kues, M, Roztocki, P, Wetzel, B, Little, BE, Chu, ST, Caspani, L, Moss, DJ & Morandotti, R 2017, Generation of complex quantum states via integrated frequency combs. in Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017., 7927012, Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017, Institute of Electrical and Electronics Engineers Inc., S. 336-337, 20th Design, Automation and Test in Europe, DATE 2017, Swisstech, Lausanne, Schweiz, 27 März 2017. https://doi.org/10.23919/DATE.2017.7927012
Reimer, C., Kues, M., Roztocki, P., Wetzel, B., Little, B. E., Chu, S. T., Caspani, L., Moss, D. J., & Morandotti, R. (2017). Generation of complex quantum states via integrated frequency combs. In Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017 (S. 336-337). Artikel 7927012 (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2017.7927012
Reimer C, Kues M, Roztocki P, Wetzel B, Little BE, Chu ST et al. Generation of complex quantum states via integrated frequency combs. in Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc. 2017. S. 336-337. 7927012. (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017). doi: 10.23919/DATE.2017.7927012
Reimer, Christian ; Kues, Michael ; Roztocki, Piotr et al. / Generation of complex quantum states via integrated frequency combs. Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. S. 336-337 (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017).
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