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Formally Verifying Analog Neural Networks with Device Mismatch Variations

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autorschaft

  • Yasmine Abu-Haeyeh
  • Thomas Bartelsmeier
  • Tobias Ladner
  • Matthias Althoff
  • Markus Olbrich

Organisationseinheiten

Externe Organisationen

  • Goethe-Universität Frankfurt am Main
  • Technische Universität München (TUM)

Details

OriginalspracheEnglisch
Titel des Sammelwerks2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
ISBN (elektronisch)9783982674100
ISBN (Print)979-8-3315-3464-6
PublikationsstatusVeröffentlicht - 31 März 2025
Veranstaltung2025 Design, Automation and Test in Europe Conference, DATE 2025
- Lyon, Frankreich
Dauer: 31 März 20252 Apr. 2025

Publikationsreihe

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Abstract

Training and running inference of large neural networks comes with excessive cost and power consumption. Thus, realizing these networks as analog circuits is an energy-and areaefficient alternative. However, analog neural networks suffer from inherent deviations within their circuits, requiring extensive testing for their correct behavior under these deviations. Unfortunately, tests based on Monte Carlo simulations are extremely time- and resource-intensive. We present an alternative approach to proving the correctness of the neural network using formal neural network verification techniques and developing a modeling methodology for these analog neural circuits. Our experimental results compare two methods based on reachability analysis showing their effectiveness by reducing the test time from days to milliseconds. Thus, they offer a faster, more scalable solution for verifying the correctness of analog neural circuits.

ASJC Scopus Sachgebiete

Zitieren

Formally Verifying Analog Neural Networks with Device Mismatch Variations. / Abu-Haeyeh, Yasmine; Bartelsmeier, Thomas; Ladner, Tobias et al.
2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2025. (Proceedings -Design, Automation and Test in Europe, DATE).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Abu-Haeyeh, Y, Bartelsmeier, T, Ladner, T, Althoff, M, Hedrich, L & Olbrich, M 2025, Formally Verifying Analog Neural Networks with Device Mismatch Variations. in 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings. Proceedings -Design, Automation and Test in Europe, DATE, Institute of Electrical and Electronics Engineers Inc., 2025 Design, Automation and Test in Europe Conference, DATE 2025
, Lyon, Frankreich, 31 März 2025. https://doi.org/10.23919/DATE64628.2025.10992891
Abu-Haeyeh, Y., Bartelsmeier, T., Ladner, T., Althoff, M., Hedrich, L., & Olbrich, M. (2025). Formally Verifying Analog Neural Networks with Device Mismatch Variations. In 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings (Proceedings -Design, Automation and Test in Europe, DATE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE64628.2025.10992891
Abu-Haeyeh Y, Bartelsmeier T, Ladner T, Althoff M, Hedrich L, Olbrich M. Formally Verifying Analog Neural Networks with Device Mismatch Variations. in 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2025. (Proceedings -Design, Automation and Test in Europe, DATE). doi: 10.23919/DATE64628.2025.10992891
Abu-Haeyeh, Yasmine ; Bartelsmeier, Thomas ; Ladner, Tobias et al. / Formally Verifying Analog Neural Networks with Device Mismatch Variations. 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2025. (Proceedings -Design, Automation and Test in Europe, DATE).
Download
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