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Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autorschaft

  • Adam Tankielun
  • Heyno Garbe
  • Werner John

Externe Organisationen

  • Universität Paderborn
  • Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (IZM)

Details

OriginalspracheEnglisch
Titel des Sammelwerks2006 IEEE International Symposium on Electromagnetic Compatibility
UntertitelEMC
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten119-124
Seitenumfang6
ISBN (Print)142440293X, 9781424402939
PublikationsstatusVeröffentlicht - 2006
Veranstaltung2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, USA / Vereinigte Staaten
Dauer: 14 Aug. 200618 Aug. 2006

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
Band1
ISSN (Print)1077-4076

Abstract

In order to compensate nonideal receiving characteristic of electric probes used in planar electromagnetic near-field scanning, scalar calibration and post-processing method based on deconvolution is proposed. The measurement setup and numerical procedure for discrete data processing is described in detail. The receiving characteristics of the probes are directly determined from scanning measurements and fullwave simulation of the specific calibration structure. Special attention is given to reduction of post-processing errors due to noisy input data. The compensation procedure is successfully validated with two probes and two planar test objects over two decades of frequency. The deconvolution method greatly improves spatial resolution of near-field scans and accurately determines distribution of normal electric field in true levels.

ASJC Scopus Sachgebiete

Zitieren

Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. / Tankielun, Adam; Garbe, Heyno; John, Werner.
2006 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2006. S. 119-124 1706276 (IEEE International Symposium on Electromagnetic Compatibility; Band 1).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Tankielun, A, Garbe, H & John, W 2006, Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. in 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC., 1706276, IEEE International Symposium on Electromagnetic Compatibility, Bd. 1, Institute of Electrical and Electronics Engineers Inc., S. 119-124, 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006, Portland, Oregon, USA / Vereinigte Staaten, 14 Aug. 2006. https://doi.org/10.1109/isemc.2006.1706276
Tankielun, A., Garbe, H., & John, W. (2006). Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. In 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC (S. 119-124). Artikel 1706276 (IEEE International Symposium on Electromagnetic Compatibility; Band 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/isemc.2006.1706276
Tankielun A, Garbe H, John W. Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. in 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc. 2006. S. 119-124. 1706276. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/isemc.2006.1706276
Tankielun, Adam ; Garbe, Heyno ; John, Werner. / Calibration of Electric Probes for Post-Processing of Near-Field Scanning Data. 2006 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2006. S. 119-124 (IEEE International Symposium on Electromagnetic Compatibility).
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abstract = "In order to compensate nonideal receiving characteristic of electric probes used in planar electromagnetic near-field scanning, scalar calibration and post-processing method based on deconvolution is proposed. The measurement setup and numerical procedure for discrete data processing is described in detail. The receiving characteristics of the probes are directly determined from scanning measurements and fullwave simulation of the specific calibration structure. Special attention is given to reduction of post-processing errors due to noisy input data. The compensation procedure is successfully validated with two probes and two planar test objects over two decades of frequency. The deconvolution method greatly improves spatial resolution of near-field scans and accurately determines distribution of normal electric field in true levels.",
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