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A pattern-based approach for improving model quality

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • Mira Balaban
  • Azzam Maraee
  • Arnon Sturm
  • Pavel Jelnov

Organisationseinheiten

Externe Organisationen

  • Ben-Gurion University of the Negev (BGU)
  • Tel Aviv University

Details

OriginalspracheEnglisch
Seiten (von - bis)1527-1555
Seitenumfang29
FachzeitschriftSoftware and systems modeling
Jahrgang14
Ausgabenummer4
Frühes Online-Datum3 Jan. 2014
PublikationsstatusElektronisch veröffentlicht (E-Pub) - 3 Jan. 2014

Abstract

UML class diagrams play a central role in modeling activities, and it is essential that class diagrams keep their high quality all along a product life cycle. Correctness problems in class diagrams are mainly caused by complex interactions among class-diagram constraints. Detection, identification, and repair of such problems require background training. In order to improve modelers’ capabilities in these directions, we have constructed a catalog of anti-patterns of correctness and quality problems in class diagrams, where an anti-pattern analyzes a typical constraint interaction that causes a correctness or a quality problem and suggests possible repairs. This paper argues that exposure to correctness anti-patterns improves modeling capabilities. The paper introduces the catalog and its pattern language, and describes experiments that test the impact of awareness to modeling problems in class diagrams (via concrete examples and anti-patterns) on the analysis capabilities of modelers. The experiments show that increased awareness implies increased identification. The improvement is remarkably noticed when the awareness is stimulated by anti-patterns, rather than by concrete examples.

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A pattern-based approach for improving model quality. / Balaban, Mira; Maraee, Azzam; Sturm, Arnon et al.
in: Software and systems modeling, Jahrgang 14, Nr. 4, 03.01.2014, S. 1527-1555.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Balaban, M, Maraee, A, Sturm, A & Jelnov, P 2014, 'A pattern-based approach for improving model quality', Software and systems modeling, Jg. 14, Nr. 4, S. 1527-1555. https://doi.org/10.1007/s10270-013-0390-0
Balaban, M., Maraee, A., Sturm, A., & Jelnov, P. (2014). A pattern-based approach for improving model quality. Software and systems modeling, 14(4), 1527-1555. Vorabveröffentlichung online. https://doi.org/10.1007/s10270-013-0390-0
Balaban M, Maraee A, Sturm A, Jelnov P. A pattern-based approach for improving model quality. Software and systems modeling. 2014 Jan 3;14(4):1527-1555. Epub 2014 Jan 3. doi: 10.1007/s10270-013-0390-0
Balaban, Mira ; Maraee, Azzam ; Sturm, Arnon et al. / A pattern-based approach for improving model quality. in: Software and systems modeling. 2014 ; Jahrgang 14, Nr. 4. S. 1527-1555.
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