TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Philipp Mand
  • Volodymyr Burkhay
  • Andre Rocke
  • Uwe Gieselmann
  • Leon Fauth
  • Markus Olbrich
  • Jurgen Beister
  • Sven Landstrom
  • Ferdinando Tonicello
  • Bernhard Wicht
  • Jens Friebe

External Research Organisations

  • European Space Research and Technology Centre (ESTEC)
  • Space Ic GmbH
  • University of Kassel
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Details

Original languageEnglish
Title of host publication2023 13th European Space Power Conference, ESPC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)9798350328998
ISBN (print)979-8-3503-2900-1
Publication statusPublished - 2023
Event13th European Space Power Conference, ESPC 2023 - Elche, Spain
Duration: 2 Oct 20236 Oct 2023

Abstract

In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.

Keywords

    Protection IC, Radiation, SEE, Single Event Effect, Space, TID, Total Ionizing Dose, Voltage Clamp

ASJC Scopus subject areas

Cite this

TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications. / Mand, Philipp; Burkhay, Volodymyr; Rocke, Andre et al.
2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Mand, P, Burkhay, V, Rocke, A, Gieselmann, U, Fauth, L, Olbrich, M, Beister, J, Landstrom, S, Tonicello, F, Wicht, B & Friebe, J 2023, TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications. in 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 13th European Space Power Conference, ESPC 2023, Elche, Spain, 2 Oct 2023. https://doi.org/10.1109/espc59009.2023.10413255
Mand, P., Burkhay, V., Rocke, A., Gieselmann, U., Fauth, L., Olbrich, M., Beister, J., Landstrom, S., Tonicello, F., Wicht, B., & Friebe, J. (2023). TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications. In 2023 13th European Space Power Conference, ESPC 2023 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/espc59009.2023.10413255
Mand P, Burkhay V, Rocke A, Gieselmann U, Fauth L, Olbrich M et al. TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications. In 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc. 2023 doi: 10.1109/espc59009.2023.10413255
Mand, Philipp ; Burkhay, Volodymyr ; Rocke, Andre et al. / TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications. 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.
Download
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title = "TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications",
abstract = "In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.",
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T1 - TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications

AU - Mand, Philipp

AU - Burkhay, Volodymyr

AU - Rocke, Andre

AU - Gieselmann, Uwe

AU - Fauth, Leon

AU - Olbrich, Markus

AU - Beister, Jurgen

AU - Landstrom, Sven

AU - Tonicello, Ferdinando

AU - Wicht, Bernhard

AU - Friebe, Jens

N1 - Publisher Copyright: © 2023 IEEE.

PY - 2023

Y1 - 2023

N2 - In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.

AB - In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.

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KW - Single Event Effect

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KW - Total Ionizing Dose

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