Scanning electron microscope JEOL JSM-7610F with Bruker EDX system

Facility/Equipment: Research Instrumentation

Details

Description

The scanning electron microscope is equipped with a Schottky field emission cathode and two powerful EDX detectors. This enables qualitative chemical analyses of phases with a high detection limit and the creation of EDX maps of natural or experimental samples. The spatial resolution is in the nm range for imaging analyses. The following detectors are available for recordings: BSE, SEI and CL.

Access to facility/equipment

NameRenat Almeev
Emails
Available for loan/bookingPlease contact the contact person

Research Service (CoreNAT - Faculty of Natural Sciences)