Size-Dependent Electrical Transport in ZrSe3-Stripes

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OriginalspracheEnglisch
Seiten (von - bis)4049–4054
Seitenumfang6
FachzeitschriftACS Applied Electronic Materials
Jahrgang7
Ausgabenummer9
Frühes Online-Datum25 Apr. 2025
PublikationsstatusVeröffentlicht - 13 Mai 2025

Abstract

The anisotropy in the form of quasi one-dimensional (1D) chains in transition metal trichalcogenides (TMTCs) makes them stand out compared to other more conventional two-dimensional (2D) materials. Here, we experimentally investigated the electrical properties of stripes of the TMTC ZrSe 3, particularly in regard to their width and thickness. For this, we compared narrow samples with wider samples where both have a comparably similar length and thickness and found that the conductivity happens dominantly in the outer selenium atoms, i.e., across the chains, showcasing the in-plane electrical anisotropy of ZrSe 3. Comparing stripes of different thicknesses shows a drastic increase in band gap energy from 0.37 eV up to 0.63 eV for thinner samples.

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Size-Dependent Electrical Transport in ZrSe3-Stripes. / Höllmann, Davin; Thole, Lars; Locmelis, Sonja et al.
in: ACS Applied Electronic Materials, Jahrgang 7, Nr. 9, 13.05.2025, S. 4049–4054.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Höllmann, D, Thole, L, Locmelis, S & Haug, RJ 2025, 'Size-Dependent Electrical Transport in ZrSe3-Stripes', ACS Applied Electronic Materials, Jg. 7, Nr. 9, S. 4049–4054. https://doi.org/10.1021/acsaelm.5c00251
Höllmann, D., Thole, L., Locmelis, S., & Haug, R. J. (2025). Size-Dependent Electrical Transport in ZrSe3-Stripes. ACS Applied Electronic Materials, 7(9), 4049–4054. https://doi.org/10.1021/acsaelm.5c00251
Höllmann D, Thole L, Locmelis S, Haug RJ. Size-Dependent Electrical Transport in ZrSe3-Stripes. ACS Applied Electronic Materials. 2025 Mai 13;7(9):4049–4054. Epub 2025 Apr 25. doi: 10.1021/acsaelm.5c00251
Höllmann, Davin ; Thole, Lars ; Locmelis, Sonja et al. / Size-Dependent Electrical Transport in ZrSe3-Stripes. in: ACS Applied Electronic Materials. 2025 ; Jahrgang 7, Nr. 9. S. 4049–4054.
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