Quick test for reversible and irreversible PID of bifacial PERC solar cells

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • Kai Sporleder
  • Marko Turek
  • Nadine Schüler
  • Volker Naumann
  • David Hevisov
  • Clemens Pöblau
  • Stephan Großer
  • Henning Schulte-Huxel
  • Jan Bauer
  • Christian Hagendorf

Externe Organisationen

  • Fraunhofer-Center für Silizium-Photovoltaik (CSP)
  • Freiberg Instruments GmbH
  • Institut für Solarenergieforschung GmbH (ISFH)
  • Universität Leipzig
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Details

OriginalspracheEnglisch
Aufsatznummer110755
FachzeitschriftSolar Energy Materials and Solar Cells
Jahrgang219
Frühes Online-Datum7 Sept. 2020
PublikationsstatusVeröffentlicht - Jan. 2021
Extern publiziertJa

Abstract

High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.

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Quick test for reversible and irreversible PID of bifacial PERC solar cells. / Sporleder, Kai; Turek, Marko; Schüler, Nadine et al.
in: Solar Energy Materials and Solar Cells, Jahrgang 219, 110755, 01.2021.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Sporleder, K, Turek, M, Schüler, N, Naumann, V, Hevisov, D, Pöblau, C, Großer, S, Schulte-Huxel, H, Bauer, J & Hagendorf, C 2021, 'Quick test for reversible and irreversible PID of bifacial PERC solar cells', Solar Energy Materials and Solar Cells, Jg. 219, 110755. https://doi.org/10.1016/j.solmat.2020.110755
Sporleder, K., Turek, M., Schüler, N., Naumann, V., Hevisov, D., Pöblau, C., Großer, S., Schulte-Huxel, H., Bauer, J., & Hagendorf, C. (2021). Quick test for reversible and irreversible PID of bifacial PERC solar cells. Solar Energy Materials and Solar Cells, 219, Artikel 110755. https://doi.org/10.1016/j.solmat.2020.110755
Sporleder K, Turek M, Schüler N, Naumann V, Hevisov D, Pöblau C et al. Quick test for reversible and irreversible PID of bifacial PERC solar cells. Solar Energy Materials and Solar Cells. 2021 Jan;219:110755. Epub 2020 Sep 7. doi: 10.1016/j.solmat.2020.110755
Sporleder, Kai ; Turek, Marko ; Schüler, Nadine et al. / Quick test for reversible and irreversible PID of bifacial PERC solar cells. in: Solar Energy Materials and Solar Cells. 2021 ; Jahrgang 219.
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title = "Quick test for reversible and irreversible PID of bifacial PERC solar cells",
abstract = "High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.",
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note = "Funding information: The authors thank the German Federal Ministry of Education and Research and the German Federal Ministry for Economic Affairs and Energy for financial support of the projects: “PID-Recovery” (project no. 0324184A ), and“NextStep” ( FKZ 0324171B ). Special thanks go to Matthias Schak and Stefan Eiternick for their support at the measurements and sample preparation.",
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AU - Sporleder, Kai

AU - Turek, Marko

AU - Schüler, Nadine

AU - Naumann, Volker

AU - Hevisov, David

AU - Pöblau, Clemens

AU - Großer, Stephan

AU - Schulte-Huxel, Henning

AU - Bauer, Jan

AU - Hagendorf, Christian

N1 - Funding information: The authors thank the German Federal Ministry of Education and Research and the German Federal Ministry for Economic Affairs and Energy for financial support of the projects: “PID-Recovery” (project no. 0324184A ), and“NextStep” ( FKZ 0324171B ). Special thanks go to Matthias Schak and Stefan Eiternick for their support at the measurements and sample preparation.

PY - 2021/1

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N2 - High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.

AB - High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.

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