Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Proceedings - IEEE 75th Electronic Components and Technology Conference, ECTC 2025 |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 1981-1985 |
| Seitenumfang | 5 |
| ISBN (elektronisch) | 9798331539320 |
| ISBN (Print) | 979-8-3315-3933-7 |
| Publikationsstatus | Veröffentlicht - 27 Mai 2025 |
| Veranstaltung | 75th IEEE Electronic Components and Technology Conference, ECTC 2025 - Dallas, USA / Vereinigte Staaten Dauer: 27 Mai 2025 → 30 Mai 2025 |
Publikationsreihe
| Name | Proceedings - Electronic Components and Technology Conference |
|---|---|
| ISSN (Print) | 0569-5503 |
Abstract
Sensors for monitoring rotational speed play a crucial role in modern machines and vehicles, with their application steadily increasing, particularly in the implementation of digital twins. Anisotropic magnetoresistive (AMR) sensors are commonly used to measure rotational speed. These sensors are typically manufactured on silicon wafers and packaged as surface-mounted components. This paper presents a novel fabrication process that utilizes an injection-molded polyether ether ketone (PEEK) substrate as the carrier. The injection molding process prestructures the PEEK substrate, enabling the production of AMR sensors through deposition and polishing processes. The evaluated signals are processed on the backside of the PEEK substrate. A demonstrator has shown that this sensor system can accurately measure and display the rotational speed.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
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- BibTex
- RIS
Proceedings - IEEE 75th Electronic Components and Technology Conference, ECTC 2025. Institute of Electrical and Electronics Engineers Inc., 2025. S. 1981-1985 (Proceedings - Electronic Components and Technology Conference).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Lithography-Free Anisotropic Magnetoresistance Sensor-Based Rotational Speed Measurement System on PEEK with Integrated Electronics
AU - Bierwirth, Tim Nils
AU - Bengsch, Sebastian
AU - Fischer, Eike Christian
AU - Werner, Michael
AU - Wurz, Marc Christopher
N1 - Publisher Copyright: © 2025 IEEE.
PY - 2025/5/27
Y1 - 2025/5/27
N2 - Sensors for monitoring rotational speed play a crucial role in modern machines and vehicles, with their application steadily increasing, particularly in the implementation of digital twins. Anisotropic magnetoresistive (AMR) sensors are commonly used to measure rotational speed. These sensors are typically manufactured on silicon wafers and packaged as surface-mounted components. This paper presents a novel fabrication process that utilizes an injection-molded polyether ether ketone (PEEK) substrate as the carrier. The injection molding process prestructures the PEEK substrate, enabling the production of AMR sensors through deposition and polishing processes. The evaluated signals are processed on the backside of the PEEK substrate. A demonstrator has shown that this sensor system can accurately measure and display the rotational speed.
AB - Sensors for monitoring rotational speed play a crucial role in modern machines and vehicles, with their application steadily increasing, particularly in the implementation of digital twins. Anisotropic magnetoresistive (AMR) sensors are commonly used to measure rotational speed. These sensors are typically manufactured on silicon wafers and packaged as surface-mounted components. This paper presents a novel fabrication process that utilizes an injection-molded polyether ether ketone (PEEK) substrate as the carrier. The injection molding process prestructures the PEEK substrate, enabling the production of AMR sensors through deposition and polishing processes. The evaluated signals are processed on the backside of the PEEK substrate. A demonstrator has shown that this sensor system can accurately measure and display the rotational speed.
KW - AMR
KW - anisotropic magnetoresistance
KW - injection molding
KW - laser direct structuring
KW - LDS
KW - MID
KW - molded interconnect device
KW - PEEK
KW - plastic substrate
KW - Polyether ether ketone
KW - rotation sensor
KW - rotational speed
KW - RPM
UR - http://www.scopus.com/inward/record.url?scp=105010582217&partnerID=8YFLogxK
U2 - 10.1109/ECTC51687.2025.00339
DO - 10.1109/ECTC51687.2025.00339
M3 - Conference contribution
AN - SCOPUS:105010582217
SN - 979-8-3315-3933-7
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1981
EP - 1985
BT - Proceedings - IEEE 75th Electronic Components and Technology Conference, ECTC 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 75th IEEE Electronic Components and Technology Conference, ECTC 2025
Y2 - 27 May 2025 through 30 May 2025
ER -