Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems |
| Untertitel | EuroSimE |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (elektronisch) | 9798350345971 |
| ISBN (Print) | 979-8-3503-4598-8 |
| Publikationsstatus | Veröffentlicht - 2023 |
| Veranstaltung | 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2023 - Graz, Österreich Dauer: 16 Apr. 2023 → 19 Apr. 2023 |
Publikationsreihe
| Name | International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems |
|---|---|
| ISSN (Print) | 2833-8553 |
| ISSN (elektronisch) | 2833-8596 |
Abstract
Bit errors due to radiation effects are becoming increasingly important as the fabrication technologies are shrinking with every generation of integrated circuits. The resulting smaller transistors are more prone to high-energy irradiation. This is relevant in avionics or even automotive, where the safety of millions of cars must be ensured. This paper proposes an experiment, where multiple FPGAs (Field Programmable Gate Arrays) are exposed to 2.45MeV neutron irradiation in parallel. Bitflips in different memory components (Block RAM, Flip-Flops, lookup-tables and configuration memory) are detected. The results show that bitflips could be detected in every memory component in every part of the FPGA. Finally, a soft-error probability model depending on the irradiation fluence can be determined. With the probability model, future implementations of fault-tolerant hardware architectures can be tested with hardware simulations using artificially generated bitflips.
ASJC Scopus Sachgebiete
- Chemische Verfahrenstechnik (insg.)
- Fließ- und Transferprozesse von Flüssigkeiten
- Informatik (insg.)
- Angewandte Informatik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Ingenieurwesen (insg.)
- Maschinenbau
- Ingenieurwesen (insg.)
- Sicherheit, Risiko, Zuverlässigkeit und Qualität
- Mathematik (insg.)
- Modellierung und Simulation
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- BibTex
- RIS
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems: EuroSimE . Institute of Electrical and Electronics Engineers Inc., 2023. ( International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure
AU - Thieu, Gia Bao
AU - Schmechel, Johannes
AU - Weide-Zaage, Kirsten
AU - Schmidt, Katharina
AU - Hagenah, Dorian
AU - Paya-Vaya, Guillermo
PY - 2023
Y1 - 2023
N2 - Bit errors due to radiation effects are becoming increasingly important as the fabrication technologies are shrinking with every generation of integrated circuits. The resulting smaller transistors are more prone to high-energy irradiation. This is relevant in avionics or even automotive, where the safety of millions of cars must be ensured. This paper proposes an experiment, where multiple FPGAs (Field Programmable Gate Arrays) are exposed to 2.45MeV neutron irradiation in parallel. Bitflips in different memory components (Block RAM, Flip-Flops, lookup-tables and configuration memory) are detected. The results show that bitflips could be detected in every memory component in every part of the FPGA. Finally, a soft-error probability model depending on the irradiation fluence can be determined. With the probability model, future implementations of fault-tolerant hardware architectures can be tested with hardware simulations using artificially generated bitflips.
AB - Bit errors due to radiation effects are becoming increasingly important as the fabrication technologies are shrinking with every generation of integrated circuits. The resulting smaller transistors are more prone to high-energy irradiation. This is relevant in avionics or even automotive, where the safety of millions of cars must be ensured. This paper proposes an experiment, where multiple FPGAs (Field Programmable Gate Arrays) are exposed to 2.45MeV neutron irradiation in parallel. Bitflips in different memory components (Block RAM, Flip-Flops, lookup-tables and configuration memory) are detected. The results show that bitflips could be detected in every memory component in every part of the FPGA. Finally, a soft-error probability model depending on the irradiation fluence can be determined. With the probability model, future implementations of fault-tolerant hardware architectures can be tested with hardware simulations using artificially generated bitflips.
UR - http://www.scopus.com/inward/record.url?scp=85158171431&partnerID=8YFLogxK
U2 - 10.1109/EuroSimE56861.2023.10100757
DO - 10.1109/EuroSimE56861.2023.10100757
M3 - Conference contribution
AN - SCOPUS:85158171431
SN - 979-8-3503-4598-8
T3 - International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems
BT - 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2023
Y2 - 16 April 2023 through 19 April 2023
ER -